Method and apparatus for measuring displacement of a sample

ABSTRACT

In a displacement measurement apparatus using light interference, a probe light path is spatially separated from a reference light path. Therefore, when a temperature or refractive index distribution by a fluctuation of air or the like, or a mechanical vibration is generated, an optical path difference fluctuates between both of the optical paths, and a measurement error is generated. In the solution, an optical axis of probe light is brought close to that of reference light by a distance which is not influenced by any disturbance, a sample is irradiated with the probe light, a reference surface is irradiated with the reference light, reflected light beams are allowed to interfere with each other, and a displacement of the sample is obtained from the resultant interference light to thereby prevent the measurement error from being generated by the fluctuation of the optical path difference.

INCORPORATION BY REFERENCE

The present application claims priority from Japanese application JP2005-090460 filed on Mar. 28, 2005, the content of which is herebyincorporated by reference into this application.

BACKGROUND OF THE INVENTION

The present invention relates to a method and an apparatus for measuringa displacement of a sample by use of light interference, moreparticularly to a method and an apparatus for measuring a displacementin which a sample is irradiated with laser light, reflected light isallowed to interfere with reference light, and a displacement of thesample is measured from the resultant interference signal.

As a method for measuring a displacement or a movement of a sample, amethod using light interference has been broadly known (Meas. Sci.Technol., 9 (1998), 1024 to 1030). One example is shown in FIG. 10.

In an interferometer shown in FIG. 10, a laser head 301 emitsdouble-frequency orthogonally polarized light beams 302 whosepolarization directions cross each other at right angles and whoseoptical frequencies are different from each other by 20 MHz. The lightbeams are split into two polarized components by a polarization beamsplitter 303. After an S-polarized light beam 303′ is reflected by thepolarization beam splitter 303, the light beam is reflected by a rightangle prism 304, and enters the polarization beam splitter 303 asreference light. A P-polarized light beam 305 passes through thepolarized light beam splitter 303. The light beam is reflected by aright angle prism 306 placed on a sample to be measured 400, and entersthe polarization beam splitter 303. Both of the reflected light beamsare combined in the polarization beam splitter 303, and pass through apolarizing plate 307 having a polarizing angle of 45° with respect topolarization directions of both of the reflected light beams to causeheterodyne interference.

This heterodyne interference light is received by a photoelectricconversion element 308, and is converted into an electric signal 309.Doppler shift frequency is added to a frequency f_(M) of the heterodyneinterference signal 309 in accordance with a moving velocity V of themeasurement sample 400, and the frequency f_(M) is given by Equation 1:f _(M) =f _(B) ±NV/λ  (1),where f_(B)=20 MHz, λ denotes a wavelength of laser light, and N=2, 4, .. . which denotes a constant determined by the number of times the lighttravels both ways in an optical path. In FIG. 10, N=2. On the otherhand, a beat signal 310 indicating f_(B)=20 MHz is output as a referencesignal from the laser head 301.

The measured heterodyne interference signal 309 and reference signal 310are input into a phase detection circuit 311, the moving velocity V anda movement 400 d of the measurement sample 400 are obtained from a phasedifference between both of the signals, and a movement output signal 312is output.

In the interferometer shown in FIG. 10, a probe optical path, that is,an optical path through which the P-polarized light beam 305 as probelight passes is spatially separated from a reference optical paththrough which the S-polarized light beam 303 as the reference lightpasses. Therefore, when a temperature or refractive index distributionis made by a fluctuation of air or the like, or a mechanical vibrationis generated, an optical path difference varies between both of theoptical paths, and this generates a measurement error of a nanometerorder. A positioning precision of the order of a sub-nanometer or lessis required in an exposure device for manufacturing a semiconductor finepattern for a 45 nm or 32 nm node in future, a stage of a patterndimension measurement apparatus, or a probe microscope for use in localcharacterization. The conventional technique shown in FIG. 10 cannotmeet the requirement. There is supposed a method of controllingenvironment factors such as temperature, humidity, and mechanicalvibration with a high precision, but economical effects remarkably dropwith regard to apparatus costs and sizes, and conveniences.

SUMMARY OF THE INVENTION

An object of the present invention is to provide a method and anapparatus for measuring displacement in which a displacement or amovement of a sample can be stably measured.

In the present invention, a light beam from a light source is split intofirst and second light beams, an optical axis of the first light beam isbrought close to that of the second light beam to irradiate a movablesample with the first light beam, and a reference surface is irradiatedwith the second light beam. Accordingly, when the reflected light beamfrom the sample is allowed to interfere with the reflected light beamfrom the reference surface, and a movement of the sample is obtainedfrom interference light, the movement of the sample can be obtained witha high precision without being influenced by any disturbance.

Moreover, in the present invention, when the optical axis of the firstlight beam is brought close to that of the second light beam, a distanceis set such that changes of physical properties of a medium around theoptical axes of the first and second light beams equally act on theoptical axes of the first and second light beams. Accordingly,influences of the disturbances equally act on two light beams, and areoffset, and it is possible to obtain the movement of the sample with thehigh precision without being influenced by any disturbance.

Furthermore, in the present invention, when the optical axis of thefirst light beam is brought close to that of the second light beam, theoptical axis of the first light beam is matched with that of the secondlight beam. Accordingly, the influences of the disturbances equally acton two light beams, and are offset, and it is possible to obtain themovement of the sample with the high precision without being influencedby any disturbance.

Additionally, in the present invention, the reference surface comprisesa diffraction grating. Accordingly, the optical axis of the first lightbeam can be matched with that of the second light beam. The influencesof the disturbances equally act on two light beams, and are offset, andit is possible to obtain the movement of the sample with the highprecision without being influenced by any disturbance.

Moreover, according to the present invention, a light beam from a lightsource is split into first and second light beams, an optical axis ofthe first light beam is brought close to that of the second light beamto irradiate the surface of a sample with the first light beam, and areference surface is irradiated with the second light beam. Accordingly,when the reflected light beam from the surface of the sample is allowedto interfere with the reflected light beam from the reference surface,and a shape of the surface of the sample is obtained from interferencelight, the surface shape of the sample can be obtained with a highprecision without being influenced by any disturbance.

According to the present invention, the influences of the disturbances,for example, a temperature or a refractive index distribution by afluctuation of air or the like, or a mechanical vibration, equally acton probe light (first light beam) and reference light (second lightbeam). Therefore, when two light beams interfere with each other, theinfluences of the disturbances can be offset. As a result, it ispossible to obtain the displacement or the movement of the sample fromthe interference light with a precision of the order of a sub-nanometeror less without being influenced by the disturbances like the airfluctuation and the mechanical vibration.

Moreover, when the above-described common optical path typeinterferometer is constituted, a displacement measurement apparatus canbe miniaturized. Therefore, the present apparatus is applicable even ina case where a space around the measurement sample is small.

Furthermore, since it is not necessary to control environmental factorssuch as temperature, humidity, and mechanical vibration, there areproduced effects that economical effects are remarkably enhanced withregard to apparatus costs and sizes, and conveniences.

These and other objects, features and advantages of the invention willbe apparent from the following more particular description ofembodiments of the invention, as illustrated in the accompanyingdrawings.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1A is a diagram showing a schematic constitution of a displacementmeasurement apparatus in Embodiment 1 of the present invention, FIG. 1Bis a diagram showing a constitution of a light source unit, and FIG. 1Cis a diagram showing double-frequency orthogonally polarized lightbeams, and a polarization direction of a polarizing plate;

FIG. 2 is a schematic diagram showing a constitution of a referencemirror in the present invention;

FIG. 3A is a constitution showing a constitution of a light source unitusing a double-frequency He—Ne laser in Embodiment 2 of the presentinvention, and FIG. 3B is a diagram showing polarization directions ofthe double-frequency orthogonally polarized light beams;

FIG. 4 is a schematic diagram showing an apparatus constitution of thedisplacement measurement apparatus which transmits the double-frequencyorthogonally polarized light beams emitted from the light source unit bya polarization-reserving fiber in Embodiment 3 of the present invention;

FIG. 5 is a schematic diagram showing an apparatus constitution of thedisplacement measurement apparatus which generates reference light byuse of a birefringent prism in Embodiment 4 of the present invention;

FIG. 6 is a schematic diagram showing an apparatus constitution of thedisplacement measurement apparatus which generates the reference lightby use of a polarization beam splitter and a reflecting mirror inEmbodiment 5 of the present invention;

FIG. 7 is a schematic diagram showing an apparatus constitution of thedisplacement measurement apparatus in which probe light reciprocatesfour times through an optical path between a ¼ wavelength plate and atarget mirror in Embodiment 6 of the present invention;

FIG. 8A is a diagram showing a schematic constitution of thedisplacement measurement apparatus in which a homodyne common opticalpath interferometer is a basic system in Embodiment 7 of the presentinvention, and FIG. 8B is a diagram showing a schematic constitution ofthe light source unit;

FIG. 9 is a schematic diagram showing an apparatus constitution of thedisplacement measurement apparatus in which the homodyne common opticalpath interferometer is a basic system in Embodiment 8 of the presentinvention; and

FIG. 10 is an explanatory view of the displacement measurement apparatususing conventional light interference.

DESCRIPTION OF THE EMBODIMENTS

Embodiments of the present invention will be described with reference tothe drawings.

Embodiment 1

A first embodiment of the present invention will be described withreference to FIG. 1. As shown in FIG. 1A, a displacement measurementapparatus of the present embodiment is constituted of a light sourceunit 2, an interferometer unit 3, and a phase detection unit 18. Asshown in FIG. 1B, in the light source unit 2, a linearly polarized lightbeam 22 from a linearly polarized laser light source 21 (e.g., afrequency-stabilized He—Ne laser having a wavelength of 632.8 nm) isallowed to enter a polarization beam splitter 23 in a polarizationdirection of 45°, and the light beam is split into two polarizationcomponents. A P-polarized light beam 24 passes through the polarizationbeam splitter 23, and an optical frequency shifts by a frequency f₁ byan acousto-optic modulator (AOM) 25 driven by the frequency f₁.

On the other hand, an S-polarized light beam 28 is reflected by thepolarization beam splitter 23, and the optical frequency shifts by afrequency f₁+f_(B) by an acousto-optic modulator 29 driven by thefrequency f₁+f_(B). Here, f_(B) is, for example, in a range of 100 kHzto several tens of MHz. After the P-polarized light beam 24 and theS-polarized light beam 28 are reflected by mirrors 26 and 26′,respectively, the light beams are synthesized by a polarization beamsplitter 27, and is reflected by a mirror 26″, so that adouble-frequency orthogonally polarized light beam 4 is emitted from thelight source unit 2. In FIG. 1C, as to the double-frequency orthogonallypolarized light beam 4, reference numeral 24P denotes a polarizationdirection of the P-polarized light beam 24, and 28S denotes apolarization direction of the S-polarized light beam 28.

The double-frequency orthogonally polarized light beam 4 enters theinterferometer unit 3, and is split into two optical paths by anon-polarization beam splitter 5. A double-frequency orthogonallypolarized light beam 6 reflected by the non-polarization beam splitter 5passes through a polarizing plate 7 having a polarizing angle in adirection of 45° with respect to both polarization directions as shownby a broken line 7 a of FIG. 1C to thereby cause heterodyneinterference. This heterodyne interference light is received by aphotoelectric conversion element 8 such as a photodiode, is convertedinto an electric signal 9 of a beat frequency f_(B), and is used asreference light. On the other hand, a double-frequency orthogonallypolarized light beam 10 passed through the non-polarization beamsplitter 5 enters a reference mirror 11. In the reference mirror 11, asshown in FIG. 2, a diffraction grating 11 g is made of a metal materialsuch as Al on a composite quartz substrate 11 b.

In this diffraction grating, as shown in FIG. 2, in the double-frequencyorthogonally polarized light beam 10, an S-polarized component 28Sparallel to a longitudinal direction of the diffraction grating isreflected, and an orthogonally P-polarized component 24P passes as such.These are properties of a wire grid polarizer. In the presentembodiment, the diffraction grating 11 g has a pitch of 144 nm, a linearwidth of 65 nm, and a height of 165 nm. An S-polarized light beam 10 rreflected by the reference mirror 11 is used as the reference light. Atransmitted P-polarized light beam 10 m is used as probe light.

After passing through a ¼ wavelength plate 12, the P-polarized lightbeam 10 m forms a circularly polarized light beam, and is reflected by atarget mirror 13 laid on a measurement sample 1 as an object to beinspected. After passing through the ¼ wavelength plate 12 again, thelight beam forms an S-polarized light beam, and is reflected by thereference mirror 11. After passing through the ¼ wavelength plate 12,the light beam is reflected as a circularly polarized light beam by thetarget mirror 13. After passing through the ¼ wavelength plate 12, thelight beam passes as a P-polarized light beam through the referencemirror 11. That is, the probe light 10 m reciprocates twice through anoptical path between the reference mirror 11 and the target mirror 13,and a movement 1 d of the measurement sample 1 is enlarged twice anddetected.

The S-polarized light beam 10 r reflected by the reference mirror 11,and the transmitted P-polarized light beam 10 m are reflected as adouble-frequency orthogonally polarized light beam 14 by thenon-polarization beam splitter 5. The double-frequency orthogonallypolarized light beam 14 passes through a polarizing plate 15 having apolarizing angle in a direction of 45° with respect to both of thepolarization directions as shown by a broken line 15 a in FIG. 1C tothereby cause the heterodyne interference. This heterodyne interferencelight is received by a photoelectric conversion element 16 such as aphotodiode, and is converted into an electric signal 17. Doppler shiftfrequency is added to a frequency f_(M) of the heterodyne interferencesignal 17 in accordance with a moving velocity V of the measurementsample 1, and the frequency f_(M) is given by Equation 1.

In Equation 1, N=4. A measured heterodyne interference signal I(t)17,and the reference signal 9 obtained by the photoelectric conversionelement 8 are input into the phase detection unit 18. The movingvelocity V and the movement 1 d of the measurement sample 1 are obtainedfrom a phase difference between both signals, and a movement signal 19is output. In the phase detection unit 18, for example, a lock-inamplifier or the like is usable. The heterodyne interference signalI(t)17 is given by Equation 2:I(t)=I _(m) +I _(r)+2(I _(m) ·I _(r))^(1/2) cos(2πf _(B)t±2πNVt/λ)  (2),where I_(m) denotes a detected intensity of the probe light, I_(r)denotes a detected intensity of the reference light, n denotes arefractive index of air, and λ denotes a wavelength of the laser light22. From the phase detection unit 18, a second term: ±2πNVt/λ of a coscomponent of Equation 2 is output as a phase signal. For example, whenthe phase signal is π/1800, the movement results in 1 d=0.044 nm.

As apparent from FIG. 1, two light beams of the probe light 10 m and thereference light 10 r directed to the target mirror 13 are emitted fromthe light source unit 2, and enter the interferometer unit 3. The lightbeams pass through completely the same optical path until the lightbeams reach the reference mirror 11, further until the light beams fromthe reference mirror 11 are received by the photoelectric conversionelement 16. That is, a common optical path type interferometer isconstituted. Therefore, even if a temperature or refractive indexdistribution by a fluctuation of air or the like is made, or amechanical vibration is generated in the optical path, thesedisturbances equally influence both of the light beams. Therefore, whenthe light beams interfere with each other, the influences of thedisturbances are completely offset, and the interference light is notinfluenced by any disturbance. The probe light 10 m only exists in theoptical path between the reference mirror 11 and the target mirror 13.However, for example, a probe microscope or the like has a stroke ofabout several hundreds of microns at most. Therefore, a gap between thereference mirror 11 and the target mirror 13 can be set to 1 mm or less,and the influence of the disturbance in such micro gap can be ignored.

Moreover, in the light source unit 2 shown in FIG. 1B, two polarizedlight beams 24, 28 crossing each other at right angles pass throughseparate optical paths, and there is a possibility that the influencesof the disturbances are superimposed between both of the optical paths.However, even if there are the influences of the disturbances, theinfluences equally act on both of the heterodyne interference light andthe reference light. Therefore, when the phase difference between bothof the light is detected in the phase detection unit 18, the influencesare offset.

By the constitution of the interferometer of the present embodiment, themoving velocity V and the movement 1 d of the measurement sample 1 canbe measured stably with a precision of the order of a sub-nanometer to apicometer without controlling environmental factors such as temperature,humidity, and acoustic vibration with a high precision. In the presentembodiment, by use of a metal diffraction grating (wire grid polarizer)as the reference mirror, the probe light is generated from one of thedouble-frequency orthogonally polarized light beams, and the referencelight can be coaxially generated from the other polarized light beam.Accordingly, the common optical path type heterodyne interferometer canbe constituted.

Embodiment 2

In the first embodiment, as shown in FIG. 1B, two polarization beamsplitters 23, 27 and two acousto-optic modulators 25, 29 are used inorder to generate the double-frequency orthogonally polarized light beam4. In a second embodiment, instead of the light source unit 2 shown inFIG. 1B in the first embodiment, as shown in FIG. 3A, a double-frequencyHe—Ne laser 31 (dual mode laser having vertical mode oscillation of twolight beams) is used. The resultant double-frequency orthogonallypolarized light beam 32 has polarization directions 32P, 32S as shown inFIG. 3B. As one example, a beat signal of about 640 MHz is obtained.Since constitutions and functions of an interferometer unit 3 and aphase detection unit 18 are similar to those of the first embodiment,description is omitted. According to the present embodiment, in the samemanner as in the first embodiment, it is possible to measure a movingvelocity V and a movement 1 d of a measurement sample 1 stably with aprecision of the order of a sub-nanometer to a picometer withoutcontrolling environmental factors such as temperature, humidity, andacoustic vibration with a high precision.

Embodiment 3

Next, in a third embodiment of the present invention, a displacementmeasurement apparatus will be described with reference to FIG. 4. In theapparatus, double-frequency orthogonally polarized light beams 4, 32emitted from a light source unit 2 are transmitted to an interferometerunit 3 by a polarization-reserving fiber. The double-frequencyorthogonally polarized light beams 4, 32 are split into a P-polarizedlight beam 42 and an S-polarized light beam 45 by a polarization beamsplitter 41. The P-polarized light beam 42 is condensed on an incidenceend surface 44 a of a polarization-reserving fiber 44 by a condensinglens 43, and transmitted while maintaining a linearly polarized lightbeam. The P-polarized light beam emitted from an emission end surface 44b of the polarization-reserving fiber 44 is formed into parallel lightbeams by a collimating lens 46, and the light beams pass through thepolarization beam splitter 41. Similarly, the S-polarized light beam 45is condensed onto an incidence end surface 44′a of apolarization-reserving fiber 44′ by a condensing lens 43′, andtransmitted while maintaining a linearly polarized light beam.

The S-polarized light beam emitted from an emission end surface 44′b ofthe polarization-reserving fiber 44′ is formed into parallel light beamsby a collimating lens 46′, and reflected by a polarization beam splitter41. The P-polarized light beam and the S-polarized light beam arecombined again into a double-frequency orthogonally polarized light beam48, and enter the interferometer unit 3. Since constitutions andfunctions of the interferometer unit 3 and a phase detection unit 18 aresimilar to those of the first embodiment, description is omitted.

It is to be noted that in the present embodiment, a light source 2′described in the second embodiment may be used instead of the lightsource 2.

According to the present embodiment, in the same manner as in the firstembodiment, it is possible to measure a moving velocity V and a movement1 d of a measurement sample 1 stably with a precision of the order of asub-nanometer to a picometer without controlling environmental factorssuch as temperature, humidity, and acoustic vibration with a highprecision. The light source unit 2 is separated from the interferometerunit 3, and is connected to the interferometer unit via thepolarization-reserving fibers 44 and 44′. Accordingly, the light sourceunit is disposed far away, and the only interferometer unit 3 isdisposed in the vicinity of the measurement sample 1. Therefore, thereis an advantage that the apparatus is applicable even to a case wherethere is not any space in the vicinity of the measurement sample 1.

Embodiment 4

Next, in a fourth embodiment of the present invention, a method ofgenerating reference light by use of a birefringent prism will bedescribed with reference to FIG. 5. In a displacement measurementapparatus of the present embodiment, since basic constitutions andfunctions of a light source unit 2 and a phase detection unit 18 aresimilar to those of the first embodiment, description is omitted. Alsoin the present embodiment, a light source 2′ described in the secondembodiment may be used instead of the light source 2.

A method of generating reference light and an interferometer unit 503only will be described hereinafter. In double-frequency orthogonallypolarized light beams 10 transmitted through a non-polarization beamsplitter 5, an optical axis of an S-polarized light beam 10 br shifts inparallel by about 200 μm by a birefringent prism 50 constituted, forexample, by laminating two optical materials 51 and 51′ indicatingbirefringent characteristics. The light beam is reflected by areflecting mirror 52 comprising a dielectric multilayered film, andreturns as reference light along an original optical path. On the otherhand, a P-polarized light beam 10 bm passes as such through thebirefringent prism 50, and is reflected as probe light by a targetmirror 13. The light beam returns along the original optical axis, iscombined with the reference light 10 br, and is reflected as adouble-frequency orthogonally polarized light beam 14 by thenon-polarization beam splitter 5. In the same manner as in the firstembodiment, as shown by a broken line 15 a of FIG. 1C, thedouble-frequency orthogonally polarized light beam 14 passes through apolarizing plate 15 having a polarizing angle in a direction of 45° withrespect to both polarization directions to cause heterodyneinterference. This heterodyne interference light is received by aphotoelectric conversion element 16, and is converted into an electricsignal 57. Since subsequent operation an signal processing are similarto those of the first embodiment, description is omitted.

As apparent from FIG. 5, two light beams of the probe light 10 bm andthe reference light 10 br directed to the target mirror 13 are emittedfrom the light source unit 2, and enter the interferometer unit 503. Thelight beams pass through completely the same optical path until thelight beams enter an incidence surface of the birefringent prism 50, andfurther until the light beams from the incidence surface of thebirefringent prism 50 are received by the photoelectric conversionelement 16. That is, a common optical path type interferometer isconstituted. Therefore, even if a temperature or refractive indexdistribution by a fluctuation or the like of air, or a mechanicalvibration is generated in the optical path, these disturbances equallyinfluence both of the light beams. When the light beams interfere witheach other, the influences of the disturbances are completely offset,and the interference light is not influenced by any disturbance. Theprobe light 10 m only exists in the optical path between the incidencesurface of the birefringent prism 50 and the target mirror 13. However,for example, a probe microscope or the like has a stroke of aboutseveral hundreds of microns at most. Therefore, a gap between theincidence surface of the birefringent prism 50 and the target mirror 13can be set to several millimeters or less, and the influence of thedisturbance in such micro gap can be ignored.

Therefore, according to the present embodiment, in the same manner as inthe first embodiment, it is possible to measure a moving velocity V anda movement 1 d of a measurement sample 1 stably with a precision of theorder of a sub-nanometer to a picometer without controllingenvironmental factors such as temperature, humidity, and acousticvibration with a high precision. In the present embodiment, by use ofthe birefringent prism 50 and the reflecting mirror 52, in thedouble-frequency orthogonally polarized light beams, probe light isgenerated from one polarized light beam, and reference light can besubstantially coaxially generated from the other polarized light beam.Therefore, a common optical path type heterodyne interferometer can beconstituted.

Embodiment 5

Next, in a fifth embodiment of the present invention, a method ofgenerating reference light by use of a polarization beam splitter and areflecting mirror will be described with reference to FIG. 6. In adisplacement measurement apparatus of the present embodiment, sincebasic constitutions and functions of a light source unit 2 and a phasedetection unit 18 are similar to those of the first embodiment,description is omitted. Moreover, in the present embodiment, a lightsource 2′ described in the second embodiment may be used instead of thelight source 2.

The method of generating the reference light and an interferometer unit603 only will be described hereinafter. About 4% of a double-frequencyorthogonally polarized light beam 4 emitted from the light source unit 2is reflected by a light beam splitter 61 (transmittance of 96%,reflectance of 4%). As shown by a broken line 7 a of FIG. 1C, areflected double-frequency orthogonally polarized light beam 62 passesthrough a polarizing plate 7 having a polarizing angle in a direction of45° with respect to both polarization directions to cause heterodyneinterference. This heterodyne interference light is received by aphotoelectric conversion element 8, is converted into an electric signal69 having a beat frequency f_(B), and is used as a reference signal.

On the other hand, a double-frequency orthogonally polarized light beam63 transmitted through the light beam splitter 61 is split into anS-polarized light beam 64 and a P-polarized light beam 65 by apolarization beam splitter 60. After passing through a ¼ wavelengthplate 12′, the S-polarized light beam 64 forms a circularly polarizedlight beam, and is reflected by a reflecting mirror 66 comprising adielectric multilayered film. After passing through the ¼ wavelengthplate 12′ again, the light beam forms a P-polarized light beam, returnsas reference light along an original optical axis, and passes throughthe polarization beam splitter 60.

After passing through a ¼ wavelength plate 12″, the P-polarized lightbeam 65 forms a circularly polarized light beam, and is reflected asprobe light by a target mirror 13. After passing through the ¼wavelength plate 12″ again, the light beam forms an S-polarized lightbeam, returns along the original optical axis, and is reflected by thepolarization beam splitter 60. Two return light beams are combined toform a double-frequency orthogonally polarized light beam 67. In thesame manner as in the first embodiment, as shown by a broken line 15 aof FIG. 1C, the light beam passes through a polarizing plate 15 having apolarizing angle in a direction of 45° with respect to both polarizationdirections to perform heterodyne interference. This heterodyneinterference light is received by a photoelectric conversion element 16,and is converted into an electric signal 68. Since subsequent operationsand signal processing are similar to those of the first embodiment,description is omitted.

As apparent from FIG. 6, two light beams of the P-polarized light beam65 and the S-polarized light beam 64 directed toward the target mirror13 are emitted from the light source unit 2, enter the interferometerunit 603, and pass through the polarization beam splitter 60 only. Evenif a temperature or refractive index distribution by a fluctuation ofair or the like, or a mechanical vibration is generated, it is supposedthat these disturbances equally influence both light beams. When thelight beams interfere with each other, the influences of thedisturbances are completely offset, the interference light is not easilyinfluenced by any disturbance. The probe light 65 passes through air inthe only optical path between the ¼ wavelength plate 12″ and the targetmirror 13. However, for example, a probe microscope or the like has astroke of about several hundreds of microns at most. Therefore, a gapbetween the ¼ wavelength plate 12″ and the target mirror 13 can be setto 1 mm or less, and the influence of the disturbance in such micro gapcan be ignored. Therefore, according to the present embodiment, in thesame manner as in the first embodiment, it is possible to measure amoving velocity V and a movement 1 d of a measurement sample 1 stablywith a precision of the order of a sub-nanometer to a picometer withoutcontrolling environmental factors such as temperature, humidity, andacoustic vibration with a high precision.

Embodiment 6

Next, a sixth embodiment of the present invention will be described withreference to FIG. 7. In the embodiment, probe light reciprocates fourtimes in an optical path between a ¼ wavelength plate and a targetmirror. In a displacement measurement apparatus of the presentembodiment, since basic constitutions and functions of a light sourceunit 2 and a phase detection unit 18 are similar to those of the firstembodiment, description is omitted. Moreover, in the present embodiment,a light source 2′ described in the second embodiment may be used insteadof the light source 2.

An interferometer unit 703 only will be described hereinafter. Adouble-frequency orthogonally polarized light beam 4 or 32 emitted fromthe light source unit 2 enters the interferometer unit 703, and isreflected by a mirror 71. Thereafter, the light beam is split into twooptical paths by a non-polarization beam splitter 70. A double-frequencyorthogonally polarized light beam 72 transmitted through thenon-polarization beam splitter 70 passes trough a polarizing plate 7having a polarizing angle in a direction of 45° with respect to bothpolarization directions as shown by a broken line 7 a of FIG. 1C tothereby perform heterodyne interference. This heterodyne interferencelight is received by a photoelectric conversion element 8, is convertedinto an electric signal 79 having a beat frequency f_(B), and is used asa reference signal.

On the other hand, a double-frequency orthogonally polarized light beam73 reflected by the non-polarization beam splitter 70 enters a referencemirror 11. As shown in FIG. 2, the reference mirror 11 is constituted byforming a diffraction grating by a metal material such as Al on acomposite quartz substrate 11 b in the same manner as in the firstembodiment. A function of the mirror is the same as that of the firstembodiment, and the mirror functions as a wire grid polarizer. AnS-polarized light beam 10 r reflected by the reference mirror 11 passesas reference light through the non-polarization beam splitter 70, and isreflected by reflecting surfaces 70 m and 70 n. Thereafter, the lightbeam passes through the non-polarization beam splitter 70 again, isreflected by the reference mirror 11, and is reflected by thenon-polarization beam splitter 70.

On the other hand, a P-polarized light beam 10 m transmitted through thereference mirror 11 is used as probe light. After passing through a ¼wavelength plate 12, the P-polarized light beam 10 m forms a circularlypolarized light beam, is reflected by a target mirror 13, passes againthrough the ¼ wavelength plate 12 to form an S-polarized light beam, andis reflected by the reference mirror 11. After passing through the ¼wavelength plate 12, the light beam is reflected as a circularlypolarized light beam by the target mirror 13. After passing through the¼ wavelength plate 12, the light beam forms a P-polarized light beam,and passes through the reference mirror 11.

The P-polarized light beam 10 m passes through the same optical path asthat of the reference light, passes through the non-polarization beamsplitter 70, and is reflected by the reflecting surfaces 70 m and 70 n.Again the light beam passes through the non-polarization beam splitter70, again passes through the ¼ wavelength plate 12 to form a circularlypolarized light beam, and is reflected by the target mirror 13. Afterpassing through the ¼ wavelength plate 12 again, the light beam forms anS-polarized light beam, and is reflected by the reference mirror 11.After passing through the ¼ wavelength plate 12, the light beam isreflected as a circularly polarized light beam by the target mirror 13.After passing through the ¼ wavelength plate 12, the light beam forms aP-polarized light beam, and passes through the reference mirror 11. Thatis, the probe light 10 m reciprocates four times through the opticalpath between the reference mirror 11 and the target mirror 13. Amovement 1 d of a measurement sample 1 is enlarged four times, and isdetected.

The P-polarized light beam 10 m is combined with the S-polarized lightbeam 10 r as the reference light to form a double-frequency orthogonallypolarized light beam 74. After the light beam is reflected by thenon-polarization beam splitter 70, the light beam is reflected by themirror 71. As shown by a broken line 15 a of FIG. 1C, thedouble-frequency orthogonally polarized light beam 74 passes through apolarizing plate 15 having a polarizing angle in a direction of 45° withrespect to both polarization directions to thereby perform heterodyneinterference. This heterodyne interference light is received by aphotoelectric conversion element 16, and is converted into an electricsignal 77. Since subsequent operation and signal processing are similarto those of the first embodiment, description is omitted.

As apparent from FIG. 7, in the same manner as in the first embodiment,two light beams of the probe light 10 m and the reference light 10 rdirected toward the target mirror 13 are emitted from the light sourceunit 2, and enter the interferometer unit 703. The light beams passthrough completely the same optical path until the light beams reach thereference mirror 11 and further until the light beams from the referencemirror 11 are received by the photoelectric conversion element 16. Thatis, a common optical path type interferometer is constituted.

Therefore, even if a temperature or refractive index distribution by afluctuation of air or the like, or a mechanical vibration is generatedin the optical path, these disturbances equally influence both of thelight beams. When the light beams interfere with each other, theinfluences of the disturbances are completely offset, and theinterference light is not influenced by any disturbance. The probe light10 m only exists in the optical path between the reference mirror 11 andthe target mirror 13. However, for example, a probe microscope or thelike has a stroke of about several hundreds of microns at most.Therefore, a gap between the reference mirror 11 and the target mirror13 can be set to 1 mm or less, and the influence of the disturbance insuch micro gap can be ignored.

Moreover, in the light source unit 2 shown in FIG. 1B, two polarizedlight beams 24, 28 crossing each other at right angles pass throughseparate optical paths, and there is a possibility that the influencesof the disturbances are superimposed between both of the optical paths.However, even if there are the influences of the disturbances, theinfluences equally act on both of the measured heterodyne interferencelight and reference light. Therefore, when a phase difference isdetected between the light in the phase detection unit 18, theinfluences are offset.

By the constitution of the interferometer of the present embodiment, itis possible to measure a moving velocity V and the movement 1 d of themeasurement sample 1 stably with a precision of the order of asub-nanometer to a picometer without controlling environmental factorssuch as temperature, humidity, and acoustic vibration with a highprecision. When a metal diffraction grating (wire grid polarizer) isused as a reference mirror in the present embodiment, in thedouble-frequency orthogonally polarized light beams, the probe light isgenerated from one polarized light beam, the reference light can becoaxially generated from the other polarized light beam, and a commonoptical path type heterodyne interferometer can be constituted.Furthermore, in the present embodiment, the probe light 10 mreciprocates four times through the optical path between the referencemirror 11 and the target mirror 13, and the movement 1 d of themeasurement sample 1 is enlarged four times and is detected. Adisplacement measurement sensitivity is obtained twice that of the firstembodiment.

Embodiment 7

In any of the first to sixth embodiments, the heterodyne common opticalpath type interferometer has been described as a basic system. Next, aseventh embodiment of the present invention will be described withreference to FIG. 8. In the present embodiment, a homodyne commonoptical path type interferometer is a basic system. As shown in FIG. 8A,in the present embodiment, a displacement measurement apparatus isconstituted of a light source unit 802, an interferometer unit 803, anda displacement detection unit 102. As shown in FIG. 8B, in the lightsource unit 802, an emitted light beam 822 from a linear polarizationlaser 821 (e.g., frequency stabilized He—Ne laser having a wavelength of632.8 nm) enters a polarization beam splitter 823 in a polarizationdirection of 45°, and is split into a P-polarized light beam 824 and anS-polarized light beam 828. The P-polarized light beam 824 passesthrough the polarization beam splitter 823, and the S-polarized lightbeam 828 is reflected by the polarization beam splitter 823. After thelight beams are reflected by mirrors 826, 826′, respectively, the lightbeams are combined by a polarization beam splitter 827, and arereflected by a mirror 826″, and an orthogonally polarized light beam 881is emitted.

That is, in the present embodiment, unlike the first embodiment, anyoptical frequency shift is not imparted to the orthogonally polarizedlight beam. In FIG. 1C, reference numeral 24P denotes a polarizationdirection of the P-polarized light beam 824 of the double-frequencyorthogonally polarized light beam 4, and 28S denotes a polarizationdirection of the S-polarized light beam 828.

As shown in FIG. 8A, the orthogonally polarized light beam 881 entersthe interferometer unit 803. In the interferometer unit 803, anorthogonally polarized light beam 882 transmitted through anon-polarization beam splitter 805 enters a reference mirror 811. Asshown in FIG. 2, the reference mirror 811 is constituted by forming adiffraction grating by a metal material such as Al on a composite quartzsubstrate 11 b in the same manner as in the first embodiment, a functionof the mirror is the same as that of the first embodiment, and themirror functions as a wire grid polarizer.

An S-polarized light beam 10 r reflected by the reference mirror 811 isused as reference light. A transmitted P-polarized light beam 10 m isused as probe light. After passing through a ¼ wavelength plate 812, theP-polarized light beam 10 m forms a circularly polarized light beam, andis reflected by a target mirror 13. After passing through the ¼wavelength plate 812 again, the light beam forms an S-polarized lightbeam, and is reflected by the reference mirror 811. After passingthrough the ¼ wavelength plate 812, the light beam is reflected as acircularly polarized light beam by the target mirror 13. After passingthrough the ¼ wavelength plate 812, the light beam forms a P-polarizedlight beam, and passes through the reference mirror 811. That is, theprobe light 10 m reciprocates twice through the optical path between thereference mirror 811 and the target mirror 13, and a movement 1 d of ameasurement sample 1 is enlarged twice, and detected.

The S-polarized light beam 10 r reflected by the reference mirror 811,and the P-polarized light beam 10 m transmitted through the mirror arecombined, and are reflected as an orthogonally polarized light beam 883by the non-polarization beam splitter 805. After the orthogonallypolarized light beam 883 passes through a ½ wavelength plate 884, apolarization direction of the light beam rotates by 45°, and the lightbeam is split into two light beams by a non-polarization beam splitter885. An orthogonally polarized light beam 886 reflected by thenon-polarization beam splitter 885 enters a polarization beam splitter887, and is split into two homodyne interference light beams 888 and 890whose phases shift from each other by 180°. The homodyne interferencelight beam 888 is received by a photoelectric conversion element 889such as a photodiode, and is converted into an electric signal 92. Thehomodyne interference light beam 890 whose phase has shifted by 180° isreceived by a photoelectric conversion element 891, and is convertedinto an electric signal 93.

An orthogonally polarized light beam 894 transmitted through thenon-polarization beam splitter 885 passes through a ¼ wavelength plate895. Thereafter, a phase difference of ±90° is added, and the light beamenters the polarization beam splitter 887, and is further split into twohomodyne interference light beams 896 and 898 whose phases shift fromeach other by 180°. The homodyne interference light beam 896 is receivedby a photoelectric conversion element 897 such as a photodiode, and isconverted into an electric signal 199. The homodyne interference lightbeam 898 whose phase has shifted by 180° is received by a photoelectricconversion element 899, and is converted into an electric signal 101.

Four homodyne interference signals 92, 93, 100, 101 are given byEquation 3 to Equation 6, respectively.

$\begin{matrix}{{I_{1} = {I_{m} + I_{r} + {2\left( {I_{m} \cdot I_{r}} \right)^{1/2}{\cos\left( {4\pi\;{{nD}/\lambda}} \right)}}}};} & (3) \\{\begin{matrix}{I_{2} = {I_{m} + I_{r} + {2\left( {I_{m} \cdot I_{r}} \right)^{1/2}{\cos\left( {{4\pi\;{{nD}/\lambda}} + \pi} \right)}}}} \\{= {I_{m} + I_{r} - {2\left( {I_{m} \cdot I_{r}} \right)^{1/2}{\cos\left( {4\pi\;{{nD}/\lambda}} \right)}}}}\end{matrix};} & (4) \\{\begin{matrix}{I_{3} = {I_{m} + I_{r} + {2\left( {I_{m} \cdot I_{r}} \right)^{1/2}{\cos\left( {{4\pi\;{{nD}/\lambda}} + {\pi/2}} \right)}}}} \\{= {I_{m} + I_{r} - {2\left( {I_{m} \cdot I_{r}} \right)^{1/2}{\sin\left( {4\pi\;{{nD}/\lambda}} \right)}}}}\end{matrix};\mspace{14mu}{and}} & (5) \\{\begin{matrix}{I_{4} = {I_{m} + I_{r} + {2\left( {I_{m} \cdot I_{r}} \right)^{1/2}{\cos\left( {{4\pi\;{{nD}/\lambda}} + {3{\pi/2}}} \right)}}}} \\{= {I_{m} + I_{r} - {2\left( {I_{m} \cdot I_{r}} \right)^{1/2}{\sin\left( {4\pi\;{{nD}/\lambda}} \right)}}}}\end{matrix},} & (6)\end{matrix}$where, I_(m) denotes a detected intensity of the probe light, I_(r)denotes a detected intensity of the reference light, n denotes arefractive index of the air, D denotes the movement 1 d of themeasurement sample 1, and λ denotes a wavelength of the laser light 822.In the displacement detection unit 102, the movement D of themeasurement sample 1 is calculated from Equation 3 to Equation 6 basedon Equation 7, and a movement signal 103 is output.D=(λ/4πn) tan⁻¹{(I ₄ −I ₃)/(I ₁ −I ₂)}  (7)

As apparent from FIG. 8A, two light beams of the probe light 10 m andthe reference light 10 r directed toward the target mirror 13 areemitted from the light source unit 802, and enter the interferometerunit 803. The light beams pass through completely the same optical pathuntil the light beams reach the reference mirror 811 and further untilthe light beams from the reference mirror 811 are received by thephotoelectric conversion elements 889, 891, 897, 899. That is, a commonoptical path type interferometer is constituted.

Thereafter, even if a temperature or refractive index distribution by afluctuation of air or the like, or a mechanical vibration is generatedin the optical path, these disturbances equally influence both of thelight beams. Therefore, when the light beams interfere with each other,the influences of the disturbances are completely offset, and theinterference light is not influenced by any disturbance. The probe light10 m only exists in the optical path between the reference mirror 811and the target mirror 13. However, for example, a probe microscope orthe like has a stroke of about several hundreds of microns at most.Therefore, a gap between the reference mirror 811 and the target mirror13 can be set to 1 mm or less, and the influence of the disturbance insuch micro gap can be ignored. In the light source unit 802 shown inFIG. 8B, two polarized light beams 824, 828 crossing each other at rightangles pass through separate optical paths, and there is a possibilitythat the influences of the disturbances are superimposed between both ofthe optical paths. However, even if there are the influences of thedisturbances, the influences equally act on four measured homodyneinterference light beams, and are offset in a process of Equation 7 inthe displacement detection unit 102.

By the constitution of the interferometer of the present embodiment, itis possible to measure a moving velocity V and the movement 1 d of themeasurement sample 1 stably with a precision of the order of asub-nanometer to a picometer without controlling environmental factorssuch as temperature, humidity, and acoustic vibration with a highprecision. When a metal diffraction grating (wire grid polarizer) isused as a reference mirror in the present embodiment, in theorthogonally polarized light beams, the probe light is generated fromone polarized light beam, the reference light can be coaxially generatedfrom the other polarized light beam, and a common optical path typehomodyne interferometer can be constituted.

Embodiment 8

Next, an eighth embodiment of the present invention will be describedwith reference to FIG. 9. In the embodiment, a homodyne interferometeris a basic system in the same manner as in the seventh embodiment. Adisplacement measurement apparatus of the present embodiment isconstituted of a light source unit 802, an interferometer unit 903, anda displacement detection unit 102 in the same manner as in the seventhembodiment. Since constitutions and functions of the light source unit802 and the displacement detection unit 102 are the same as those of theseventh embodiment, description is omitted. An orthogonally polarizedlight beam 881 emitted from the light source unit 802 enters theinterferometer unit 903. In the interferometer unit 903, an orthogonallypolarized light beam 982 transmitted through a non-polarization beamsplitter 905 enters a reference mirror 911. As shown in FIG. 2, thereference mirror 911 is constituted by forming a diffraction grating bya metal material such as Al on a composite quartz substrate 11 b in thesame manner as in the reference mirror 11 of the first embodiment, afunction of the mirror is the same as that of the first embodiment, andthe mirror functions as a wire grid polarizer. An S-polarized light beam10 r reflected by the reference mirror 911 is used as reference light.

A transmitted P-polarized light beam 10 m is used as probe light. Afterpassing through a ¼ wavelength plate 912, the P-polarized light beam 10m forms a circularly polarized light beam, and is reflected by a targetmirror 13. After passing through the ¼ wavelength plate 912 again, thelight beam forms an S-polarized light beam, and is reflected by thereference mirror 911. After passing through the ¼ wavelength plate 912,the light beam is reflected as a circularly polarized light beam by thetarget mirror 13. After passing through the ¼ wavelength plate 912, thelight beam forms a P-polarized light beam, and passes through thereference mirror 911. That is, the probe light 10 m reciprocates twicethrough the optical path between the reference mirror 911 and the targetmirror 13, and a movement 1 d of a measurement sample 1 is enlargedtwice, and detected. The S-polarized light beam 10 r reflected by thereference mirror 911 is combined with the transmitted P-polarized lightbeam 10 m, and is reflected as an orthogonally polarized light beam 983by the non-polarization beam splitter 905. The orthogonally polarizedlight beam 983 is enlarged by a light beam expander 201.

This enlarged light beam 202 is divided into four orthogonally polarizedlight beams 204, 205, 206, 207 by a diffractive optical element (DOE)203, and the light beams enter a phase shift mask 208 made of abirefringent material. This phase shift mask 208 is divided into fourregions 208 a, 208 b, 208 c, 208 d corresponding to four orthogonallypolarized light beams 204 to 207 to impart phase shifts of 0°, 90°,180°, 270° between polarized light beams passing through each region andcrossing each other at right angles. Four orthogonally polarized lightbeams provided with the phase shifts pass through a polarizing plate 209having a polarizing angle in a direction of 45° with respect to bothpolarization directions to perform homodyne interference.

Four homodyne interference light beams 210 to 213 are received by aphotoelectric conversion element 214, and are converted into electricsignals 215 to 218. Four homodyne interference signals 215 to 218 aregiven by Equation 3 to Equation 6, respectively, in the same manner asin the seventh embodiment. In the displacement detection unit 102, amovement D of the measurement sample 1 is calculated from Equation 3 toEquation 6 based on Equation 7, and a movement signal 103 is output.

As apparent from FIG. 9, two light beams of the probe light 10 m and thereference light 10 r directed toward the target mirror 13 are emittedfrom the light source unit 902, and enter the interferometer unit 903.The light beams pass through completely the same optical path until thelight beams reach the reference mirror 911 and further until the lightbeams from the reference mirror 911 are received by the photoelectricconversion element 214. That is, a common optical path typeinterferometer is constituted. Therefore, even if a temperature orrefractive index distribution by a fluctuation of air or the like, or amechanical vibration is generated in the optical path, thesedisturbances equally influence both of the light beams. Therefore, whenthe light beams interfere with each other, the influences of thedisturbances are completely offset, and the interference light is notinfluenced by any disturbance. The probe light 10 m only exists in theoptical path between the reference mirror 911 and the target mirror 13.However, for example, a probe microscope or the like has a stroke ofabout several hundreds of microns at most. Therefore, a gap between thereference mirror 911 and the target mirror 13 can be set to 1 mm orless, and the influence of the disturbance in such micro gap can beignored.

By the constitution of the interferometer of the present embodiment, itis possible to measure a moving velocity V and the movement 1 d of themeasurement sample 1 stably with a precision of the order of asub-nanometer to a picometer without controlling environmental factorssuch as temperature, humidity, and acoustic vibration with a highprecision. When a metal diffraction grating (wire grid polarizer) isused as a reference mirror in the present embodiment, in theorthogonally polarized light beams, the probe light is generated fromone polarized light beam, the reference light can be coaxially generatedfrom the other polarized light beam, and a common optical path typehomodyne interferometer can be constituted. In the present embodiment,the DOE 203, and the flat phase shift mask 208 are used in generatingfour interference light beams whose phases have been shifted. Therefore,there are advantages that the constitution of the interferometer unit903 is simplified, stability increases, and dimensions are reduced.Therefore, the apparatus is applicable even to a case where there is notany space around the measurement sample 1.

The embodiments of the present invention have been described above inaccordance with the example where the movement 1 d of the measurementsample 1 is measured. Examples of the measurement sample 1 include astage or the like of a semiconductor exposure device, an inspectiondevice or the like, a stage on which a probe of a probe microscope or ameasurement sample is mounted, and a working tool (turning tool, etc.).Furthermore, the present invention is not limited to these embodiments.For example, the target mirror 13 is removed, the surface of the sample1 is directly irradiated with the probe light 10 m, and measurement isperformed while moving the sample 1 in a direction crossing the probelight 10 m at right angles. In this case, it is possible to measuremicro irregularities of the sample 1 surface with a resolution of asub-nanometer to a picometer with a good precision. Examples of a samplein this case include surface roughness of a magnetic disc surface or amagnetic head float-up surface, components of micro-electro-mechanicalsystems (MEMS) such as micro lenses and the like. When a condensing lensis inserted between the reference mirror 11 and the sample 1, anin-plane spatial resolution also reaches the order of a sub-micron.

Moreover, it is obvious that the third embodiment of the presentinvention can be combined with the fourth to eighth embodiments.

The invention may be embodied in other specific forms without departingfrom the spirit or essential characteristics thereof. The presentembodiment is therefore to be considered in all respects as illustrativeand not restrictive, the scope of the invention being indicated by theappended claims rather than by the foregoing description and all changeswhich come within the meaning and range of equivalency of the claims aretherefore intended to be embraced therein.

1. A method of measuring a displacement of a sample to be inspected,comprising: splitting a light beam emitted from a light source into afirst light beam and a second light beam; detecting the first light beamwith a first sensor; irradiating a reference mirror having a diffractiongrating for reflecting a first polarization state light beam and passinga second polarization state light beam with light having the firstpolarization state among the split second light beam, and reflecting thelight having a first polarization state by the reference mirror;irradiating a sample with light having the second polarization stateamong the split second light beam, and reflecting the light having thesecond polarization state by the sample; generating an interferencelight by overlapping light reflected by the reference mirror with lightreflected from the sample, and passing the overlapped lights through apolarizing plate; detecting the interference light with a second sensor;and extracting displacement information of the sample by processing asignal output from the first sensor corresponding to the first lightbeam and a signal output from the second sensor corresponding to theinterference light.
 2. The method of measuring the displacementaccording to claim 1, wherein the step of irradiating the referencemirror further includes a step of reflecting the light having a firstpolarization state such that its optical axis and an optical axis of thelight having a second polarization state deviate from each otherpartially or entirely in a same medium.
 3. The method of measuring thedisplacement according to claim 1, wherein the step of irradiating thereference mirror further includes a step of reflecting the light havinga first polarization state such that its optical axis and an opticalaxis of the light having a second polarization state are coaxial.
 4. Amethod of measuring a displacement of a sample to be inspected,comprising the steps: splitting a light beam emitted from a light sourceinto first polarized light beam and a second polarized light beam;irradiating the sample with the second polarized light beam; irradiatingwith the first polarized light beam a reference surface disposed on anoptical axis of the first polarized light beam, and allowing a reflectedlight beam from the sample by the irradiation with the second polarizedlight beam to interfere with a reflected light beam from the referencesurface by the irradiation with the first polarized light beam togenerate interference light; and extracting displacement information ofthe sample from information included in the interference light; whereinthe step of irradiating a reference surface comprises a step ofirradiating a reference surface having a diffraction grating forreflecting the first polarized light and passing the second polarizedlight.
 5. An apparatus for measuring a displacement of a sample to beinspected, comprising: a light source for emitting a laser beam; a beamsplitter for splitting a light beam emitted from the light source into afirst light beam and second light beam; a first sensor for detecting thefirst light beam; a reference mirror having a diffraction grating forreflecting a first polarization state light beam and passing a secondpolarization state light beam for reflecting light having a firstpolarization state in the split second light beam; a reflector installedon a sample for reflecting light having a second polarization state inthe split second light beam which is not reflected by the referencemirror; an interference light generator for generating an interferencelight by overlapping light reflected by the reference mirror with lightreflected by the reflector installed on the sample, and passing theoverlapped lights through a polarizing plate; a second sensor fordetecting the interference light generated by the interference lightgenerator; and a processor for processing a signal output from the firstsensor corresponding to the first light beam and a signal output fromthe second sensor corresponding to the interference light, andextracting displacement information of the sample.
 6. The apparatus formeasuring the displacement according to claim 5, wherein an optical axisof the light having a first polarization state and an optical axis ofthe light having a second polarization state deviate from each otherpartially or entirely in a same medium.
 7. The apparatus for measuringthe displacement according to claim 5, wherein an optical axis of thelight having a first polarization state and an optical axis of the lighthaving a second polarization state are coaxial.
 8. An apparatus formeasuring displacement of an object to be inspected, comprising: a lightsource; splitting means for splitting a light beam emitted from thelight source into a first polarized light beam and a second polarizedlight beam; irradiating means for irradiating the sample with the secondpolarized light beam split by the splitting means, and irradiating areference surface with the first polarized light beam; interfering meansfor allowing a reflected light beam from the sample irradiated with thesecond polarized light beam by the irradiating means to interfere withthe reflected light beam from the reference surface irradiated with thesecond polarized light beam by the irradiating means to generateinterference light; and displacement information extracting means fordetecting the interference light generated by the interfering means toobtain displacement information of the sample; wherein the referencesurface further comprises a diffraction grating for reflecting the firstpolarized light beam and passing the second polarized light beam.
 9. Theapparatus for measuring displacement according to claim 5, wherein thereflector includes a dielectric multilayered film.